XPS Insight Note: Carbon Sp2–Sp3 Ratios Derived From the Carbon Auger Signal and Its Accuracy

Abstract

Understanding the surface chemistry of carbon materials is typically explored using x-ray photoelectron spectroscopy (XPS). Researchers typically focus on the C(1s) core-level to deduce chemistry, often overlooking complementary spectral information. This insight note summarizes the use of the x-ray excited Auger peak for carbon, deriving the D-parameter to aid in the measurement of sp2—sp3 ratios.