Critchley and Van Cutsem [7J recently developed the properties of dissimi- larities and ultrametries with values in an ordered set. This theoretical· definition allows consideration of a pair of ultrametrics as a two dimensional ultrametrie with values in lR+ x lR+, and provides a good framework to study the dependence between two ultramet- ries. In this paper, we just present the basie definitions for introducing the definition of some new indices of dependence or of comparison of two real-valued ultrametrics. Details can be found in Benkaraache's thesis [4J.
CITATION STYLE
Benkaraache, T., & Van Cutsem, B. (1994). Comparison of hierarchical classifications (pp. 85–92). https://doi.org/10.1007/978-3-642-51175-2_8
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