Structured channel metamaterials for deep sub-wavelength resolution in guided ultrasonics

Abstract

Experimental results on deep subwavelength resolution of defects are presented for the first time in the context of guided ultrasonic wave inspection of defects, using novel "structured channel"metamaterials. An Aluminum bar with side-drilled holes is used as a test sample, interrogated by the fundamental bar-guided symmetric mode. Simulations were conducted to optimize dimensional parameters of the metamaterial structure. Experiments using metamaterials fabricated accordingly demonstrate a resolution down to 1/72 of the operating wavelength, potentially bringing the resolution of guided wave inspection to the same range as that of bulk ultrasonics. This work has much promise for remote inspection in industry and biomedicine.