Surface layering and melting in an ionic liquid studied by resonant soft X-ray reflectivity

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Abstract

The molecular-scale structure of the ionic liquid [C18mim]+[FAP]- near its free surface was studied by complementary methods. X-ray absorption spectroscopy and resonant soft X-ray reflectivity revealed a depth-decaying near-surface layering. Element-specific interfacial profiles were extracted with submolecular resolution from energy-dependent soft X-ray reflectivity data. Temperature- dependent hard X-ray reflectivity, small- and wide-angle Xray scattering, and infrared spectroscopy uncovered an intriguing melting mechanism for the layered region, where alkyl chain melting drove a negative thermal expansion of the surface layer spacing.

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Mezger, M., Ocko, B. M., Reichert, H., & Deutsch, M. (2013). Surface layering and melting in an ionic liquid studied by resonant soft X-ray reflectivity. Proceedings of the National Academy of Sciences of the United States of America, 110(10), 3733–3737. https://doi.org/10.1073/pnas.1211749110

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