Characterization of detector-grade CdZnTe crystals grown by traveling heater method (THM)

Abstract

This work focuses on the 3. Resultsanddiscussioncharacterization of 10×10×10 mm3 THM-grown CdZnTe detector-grade crystals that have been post-growth annealed to remove the secondary phases (SPs). All three detectors showed an average energy resolution of ∼1.63% for a small guarded pixel with 3.5 mm diameter, measured using 137Cs-662 keV with an average peak-to-Compton ratio of 2.7. The characterization showed vestiges of SPs and micro-twins present in some of the crystals indicating that the SPs prior to annealing were large and had size in the range of 100-500 μm. The various detectable structural features, such as micron twins, strains and sub-micron level of Te inclusions seemed to have little or no influence in the radiation spectrometer performance of the detectors; this is possibly because they are either having low density or electrically inactive. © 2009 Elsevier B.V. All rights reserved.