Abstract
The electrochemistry of Cu(I) oxide (Cu 2 O) was examined in the 66.7-33.3% mole fraction (m/o) urea-choline chloride melt. Electrochemical parameters that were measured include the standard heterogeneous rate constant and transfer coefficient of the Cu(I)/Cu(II) reaction and the Cu(I) diffusion coefficient. Data about the density, equivalent conductance, and absolute viscosity of this melt were obtained over the temperature range of 298-353 K. The conductivity and viscosity exhibited the non-Arrhenius behavior typical of glass-forming liquids. Overall, the physicochemical properties of the urea-choline chloride melt are comparable to those of common room-temperature ionic liquids. The electrodeposition of Cu was examined on glassy carbon and platinum electrodes by using potential-step techniques. The critical number of atoms required for the formation of a stable nucleus on glassy carbon was ∼0, indicating that active sites on the electrode surface served as critical nuclei. Cu deposits on Ni substrates were dense, nodular, and compact. © 2010 The Electrochemical Society.
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CITATION STYLE
Tsuda, T., Boyd, L. E., Kuwabata, S., & Hussey, C. L. (2010). Electrochemistry of Copper(I) Oxide in the 66.7–33.3 mol % Urea–Choline Chloride Room-Temperature Eutectic Melt. Journal of The Electrochemical Society, 157(8), F96. https://doi.org/10.1149/1.3377117
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