Abstract
We have been developing a new implementation of quantum voltage noise source (QVNS), an integrated QVNS (IQVNS), for Johnson noise thermometry (JNT) in thermal metrology. We designed an IQVNS chip based on rapid single flux quantum (RSFQ) technology. A general formula for the output power spectrum has been derived by using a Fourier analysis method, which shows that the spectrum is calculable with sufficiently small errors for practical JNT measurements. © Published under licence by IOP Publishing Ltd.
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CITATION STYLE
Maezawa, M., Yamada, T., & Urano, C. (2014). Integrated quantum voltage noise source for Johnson noise thermometry. In Journal of Physics: Conference Series (Vol. 507). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/507/4/042023
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