Hardness and stress of amorphous carbon films deposited by glow discharge and ion beam assisting deposition

9Citations
Citations of this article
14Readers
Mendeley users who have this article in their library.

Abstract

The hardness and stress of amorphous carbon films prepared by glow discharge and by ion beam assisting deposition are investigated. Relatively hard and almost stress free amorphous carbon films were deposited by the glow discharge technique. On the other hand, by using the ion beam assisting deposition, hard films were also obtained with a stress of the same order of those found in tetrahedral amorphous carbon films. A structural analysis indicates that all films are composed of a sp2-rich network. These results contradict the currently accepted concept that both stress and hardness are only related to the concentration of sp3 sites. Furthermore, the same results also indicate that the sp2 sites may also contribute to the hardness of the films.

Cite

CITATION STYLE

APA

Marques, F. C., & Lacerda, R. G. (2000). Hardness and stress of amorphous carbon films deposited by glow discharge and ion beam assisting deposition. Brazilian Journal of Physics, 30(3), 527–532. https://doi.org/10.1590/S0103-97332000000300008

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free