Advances in Extreme-Scale 3D EM: Specimen Preparation and Recording Systems for Electron Microscopic Tomography and Serial Block Face SEM

M Ellisman; T Deerinck; E Bushong; J Bouwer; T Shone; L Jin; A Milazzo; S Peltier; N-H Xuong

Journal ArticleOPEN ACCESS

Advances in Extreme-Scale 3D EM: Specimen Preparation and Recording Systems for Electron Microscopic Tomography and Serial Block Face SEM

Ellisman M
Deerinck T
Bushong E
et al.

Microscopy and Microanalysis (2011) 17(S2) 976-977

DOI: 10.1017/s1431927611005757

N/ACitations

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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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CITATION STYLE

APA

Ellisman, M., Deerinck, T., Bushong, E., Bouwer, J., Shone, T., Jin, L., … Xuong, N.-H. (2011). Advances in Extreme-Scale 3D EM: Specimen Preparation and Recording Systems for Electron Microscopic Tomography and Serial Block Face SEM. Microscopy and Microanalysis, 17(S2), 976–977. https://doi.org/10.1017/s1431927611005757

Advances in Extreme-Scale 3D EM: Specimen Preparation and Recording Systems for Electron Microscopic Tomography and Serial Block Face SEM

Abstract

Cite

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