Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Cite
CITATION STYLE
APA
Hartel, P., Müller, H., Uhlemann, S., Zach, J., & Haider, M. (2010). Benefits of Simultaneous C c - and C s -Correction. Microscopy and Microanalysis, 16(S2), 114–115. https://doi.org/10.1017/s1431927610055133
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