Characterization of Carbon Nanostructures by Photoelectron Spectroscopies

Abstract

Recently, the scientific community experienced two revolutionary events. The first was the synthesis of single-layer graphene, which boosted research in many different areas. The second was the advent of quantum technologies with the promise to become pervasive in several aspects of everyday life. In this respect, diamonds and nanodiamonds are among the most promising materials to develop quantum devices. Graphene and nanodiamonds can be coupled with other carbon nanostructures to enhance specific properties or be properly functionalized to tune their quantum response. This contribution briefly explores photoelectron spectroscopies and, in particular, X-ray photoelectron spectroscopy (XPS) and then turns to the present applications of this technique for characterizing carbon nanomaterials. XPS is a qualitative and quantitative chemical analysis technique. It is surface-sensitive due to its limited sampling depth, which confines the analysis only to the outer few top-layers of the material surface. This enables researchers to understand the surface composition of the sample and how the chemistry influences its interaction with the environment. Although the chemical analysis remains the main information provided by XPS, modern instruments couple this information with spatial resolution and mapping or with the possibility to analyze the material in operando conditions at nearly atmospheric pressures. Examples of the application of photoelectron spectroscopies to the characterization of carbon nanostructures will be reviewed to present the potentialities of these techniques.