Abstract
'Bohm diffusion' causes the electrons to diffuse perpendicularly to the magnetic field lines. However, its origin is not yet completely understood: low and high frequency electric field fluctuations are both named to cause Bohm diffusion. The importance of including this process in a Monte Carlo (MC) model is demonstrated by comparing calculated ionization rates with particle-in-cell/Monte Carlo collisions (PIC/MCC) simulations. A good agreement is found with a Bohm diffusion parameter of 0.05, which corresponds well to experiments. Since the PIC/MCC method accounts for fast electric field fluctuations, we conclude that Bohm diffusion is caused by fast electric field phenomena. © 2010 IOP Publishing Ltd.
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CITATION STYLE
Bultinck, E., Mahieu, S., Depla, D., & Bogaerts, A. (2010). The origin of Bohm diffusion, investigated by a comparison of different modelling methods. Journal of Physics D: Applied Physics, 43(29). https://doi.org/10.1088/0022-3727/43/29/292001
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