Feasibility of Physical Unclonable Functions from Pre-stressed Organic Thin Film Transistors for Secure Microelectronics

Abstract

Pre-stressed commercial Organic Thin Film Transistors (OTFT) have been characterized to evaluate their suitability for Physical Unclonable Functions (PUFs) implementation, when the variability of the drain current (ID) is used as entropy source. Different kinds of electrical pre-stresses have been considered, to study their impact on the PUF reproducibility. Uniqueness and Uniformity of the resulting PUFs have also been evaluated. The proposed pre-stressed OTFTs based PUFs show a reproducibility up to 0.99, with a uniformity and uniqueness of 0.52 and 0.50, respectively.