Effects of faults and shunt reactor parameters on parallel resonance

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Abstract

It is shown that more shunt reactor values may cause resonance on paralleled EHV lines than has been reported previously [1, 2, 3, 4] when faults on the opened circuit are analyzed. This is verified by approximate electrostatic calculations and detailed system calculations for various reactor and transformer configurations. The importance of evaluating reactor zero-sequence currents and secondary-arc currents, as well as the coupled voltages, is illustrated and a TNA simulation of parallel resonance is also included. General electrostatic equations are derived for all fault conditions and applied to specific transposition schemes and reactor and transformer configurations, making it possible to readily evaluate a potential parallel resonance problem with minimum effort for typical configurations. Equations for other configurations can be easily derived. Copyright © 1981 by The Institute of Electrical and Electronics Engineers, Inc.

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Reid, W. E. (1981). Effects of faults and shunt reactor parameters on parallel resonance. IEEE Transactions on Power Apparatus and Systems, PAS-100(2), 572–584. https://doi.org/10.1109/TPAS.1981.316914

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