Atomic force microscopy manipulation with ultrasonic excitation

Abstract

The exposure of nanostructures to ultrasound renders the opportunity to explore novel methods to control their assembly. In the presence of surface ultrasonic vibration, large Sb nanoparticles on MoS2 substrates can be laterally displaced using the tip of a compliant AFM cantilever by just increasing the ultrasonic excitation amplitude. Magnetic nanoparticles of about 10-20 nm in diameter are swept by the tip when scanning in contact mode in the absence of ultrasound, but remain undisturbed in the presence of low amplitude ultrasonic vibration. In Atomic Force Microscopy-assisted manipulation of nanoparticles, ultrasonic vibration affects both tip-particle and particle-surface frictional properties. © 2008 IOP Publishing Ltd.