An Automated Test Set for High Resolution Analog-to-Digital and Digital-to-Analog Converters

Abstract

An automated test set is described for characterizing the static performance of high resolution ADC's and DAC's. Measured parameters include gain, offset linearity, and equivalent ADC input noise with uncertainties of 2–4 ppm. Measurements to full accuracy can be made at a rate up to 40/s. A 20-bit DAC serves as a comparison standard. Copyright © 1979 by The Institute of Electrical and Electronics Engineers, Inc.