Defects in MOFs: A thorough characterization

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Abstract

As indicated by nearly perfect XRD data, but challenged by a two-signal IR spectrum of CO guest molecules, it is confirmed by computer simulations and XPS experiments that the most defect-free SURMOFs contain about 4 % defective Cu sites. © 2012 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim.

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St. Petkov, P., Vayssilov, G. N., Liu, J., Shekhah, O., Wang, Y., Wöll, C., & Heine, T. (2012). Defects in MOFs: A thorough characterization. ChemPhysChem, 13(8), 2025–2029. https://doi.org/10.1002/cphc.201200222

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