Error analysis and calibration of a spectroscopic Mueller matrix polarimeter using a short-pulse laser source

Abstract

This paper deals with an error analysis together with the calibration of a spectroscopic Mueller polarimeter with dual rotating retarders; both of them take into consideration the elliptical birefringence characteristics of each rotating device. In doing so, the precision currently given for the Mueller matrix elements is drastically improved. Simulations enabled us, first, to determine the measurement error on each element of the Mueller matrix without a sample and, second, to adopt a method of calibration. Experimental results and corrections highlight the interest of taking elliptical birefringence and dichroism into account.