Abstract
Polarized Raman scattering by phonons is used to characterize thin films prepared by laser ablation of La1-xCaxMnO3 targets. It was found that, in the temperature range from 6 to 300 K, phonon spectra of La0.7Ca0.3MnO3 films exhibit observable differences from those in bulk materials (microcrystalline ceramics and single crystals). A significant difference was found in the spectra of "as-grown" films compared to those annealed in oxygen at 800°C. The observed Raman peaks and their linewidths exhibit an irregular temperature dependence near Tc. A correlation of Raman data with magnetization of the sample was also found. © 1998 American Institute of Physics.
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CITATION STYLE
Podobedov, V. B., Romero, D. B., Weber, A., Rice, J. P., Schreekala, R., Rajeswari, M., … Drew, H. D. (1998). Diagnostics of “colossal” magnetoresistance manganite films by Raman spectroscopy. Applied Physics Letters. https://doi.org/10.1063/1.122723
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