Abstract
The microstructure of the grain boundaries and solute segregation are studied for 0.3 mol%CuO doped 3 mol% yttria-stabilized zirconia (3Y-TZP) using TEMs equipped with EDS and EELS. The observations revealed grain boundaries of various thickness ranging from a sharp boundary without any extra phase to those with amorphous-like phase, of up to 2 nm thickness in between. There were also pockets filled with amorphous-like phase at the triple junctions of grain boundaries. Segregation of Cu and Y were observed not only in these amorphous-like regions but also along sharp grain boundaries without any extra phase.
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Onda, T., Lloyd, S. J., Suematsu, H., Yamauchi, H., Greer, A. L., Kurashima, K., … Hayakawa, M. (2001). Grain boundary structure and solute segregation in CuO doped 3 mol% yttria stabilized zirconia. Materials Transactions, 42(1), 145–150. https://doi.org/10.2320/matertrans.42.145
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