Weibull-exponential distribution and its application in monitoring industrial process

Abstract

This paper presents a new Weibull family of distributions. The compatibility of the newly developed class is justified through its application in the field of quality control using Weibull-exponential distribution, a special case of the proposed family. In this paper, an attribute control chart using Weibull-exponential distribution is developed. The estimations of the model parameters and the proposed chart parameters are performed through the methods of maximum likelihood and average run-length. The significance of the proposed model is demonstrated using a simulation study and real-life problems. The results of the monitoring process and quick detection are compared with exponential distribution.