Abstract
A novel XAFS measurement system has been developed in which XAFS measurements can be performed including sample-loading and detector adjustments. With this system, XAFS measurements of up to 80 samples in both transmission and fluorescence modes can be carried out. The adjustment of the optical components has also been automated. It not only saves manpower and measurement time, but also improves the accuracy and reliability of sample alignments. © 2012 International Union of Crystallography Printed in Singapore - all rights reserved.
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Oji, H., Taniguchi, Y., Hirayama, S., Ofuchi, H., Takagaki, M., & Honma, T. (2012). Automatic XAFS measurement system developed at BL14B2 in SPring-8. Journal of Synchrotron Radiation, 19(1), 54–59. https://doi.org/10.1107/S0909049511042518
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