A Review Paper based on Built in Self Test

Abstract

In the era of submicron technology memories may develop failure during the operation within their expected lifetime. The circuit needs to put on test mode and validates that whether it is free of fault or not, with the assumption that they would not damage within the expected life span, as the technology is shrinking assumption does not hold for the modern day. In the virtue of submicron technology to conquer such problem redundant circuitry kept on chips which replace the faulty part. It tests circuit every time before they start up. Module sensitizes the fault and propagates the effect to the output of CUT the main emphasis of the circuit design is to have low area and high speed, and low power. It generates many patterns for 0 to 2^n if there are n flip-flops. The BIST a redundant circuit kept on the chip which replaces the erroneous circuit with the error-free part. This paper concluded basic test problems and some reliable methods of solution are discussed. The basic concept of BIST is that it provides a path by which system could test it.