Abstract
We report an fcc structure for the epitaxial Gd2O3 films grown on GaAs(100). This fluorite-derived structure appears to be stabilized by epitaxy with the substrate and has a great similarity to the GaAs structure. A model calculation supports this finding. Our secondary-electron imaging studies of these nanometer-thick films reveal that the films are cubic as deposited, and this structure can be derived from the stable α-phase of the Gd2O3 by a mild Ne+ -ion bombardment and a subsequent anneal. These epitaxial Gd2O3 films have great importance because of their excellent surface passivation properties.
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CITATION STYLE
Steiner, C., Bolliger, B., Erbudak, M., Hong, M., Kortan, A. R., Kwo, J., & Mannaerts, J. P. (2000). Structural modifications of the Gd2O3(110) films on GaAs(100). Physical Review B - Condensed Matter and Materials Physics, 62(16), R10614–R10617. https://doi.org/10.1103/PhysRevB.62.R10614
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