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Advanced materials nanocharacterization

Nanoscale Research Letters
DOI: 10.1186/1556-276X-6-107
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Abstract

This special issue of Nanoscale Research Letters contains scientific contributions presented at the Symposium D "Multidimensional Electrical and Chemical Characterization at the Nanometer-scale of Organic and Inorganic Semiconductors" of the E-MRS Fall Meeting 2010, which was held in Warsaw, Poland from 13th to 17th September, 2010. © 2011 Giannazzo et al.

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Giannazzo, F., Eyben, P., Baranowski, J., Camassel, J., & Lányi, S. (2011). Advanced materials nanocharacterization. Nanoscale Research Letters. Springer New York LLC. https://doi.org/10.1186/1556-276X-6-107

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