Depth distribution of martensite in xenon-implanted stainless steels

Abstract

The amount of stress-induced martensite and its distribution in depth in xenon-implanted austenitic stainless-steel poly- and single crystals have been measured by Rutherford backscattering and channeling analysis, depth-selective conversion-electron Mössbauer spectroscopy, cross-sectional transmission electron microscopy and X-ray diffraction analysis. In low-nickel 17 7, 304 and 316 commercial stainless steels and in 17:13 single crystals the martensitic transformation starts at the surface and develops towards greater depth with increasing xenon fluence. The implanted layer is nearly completely transformed, and the interface between martensite and austenite is rather sharp and well defined. In high-nickel 310 commercial stainless steel and 19:15 and 19:20 single crystals, on the other hand, only insignificant amounts of martensite are observed. © 1990.