Synchrotron‐based X‐Ray Approaches for Examining Toxic Trace Metal(loid)s in Soil–Plant Systems

Abstract

© American Society of Agronomy, Crop Science Society of America, and Soil Science Society of America. 5585 Guilford Rd., Madison, WI 53711 USA. Elevated levels of trace metal(loid)s reduce plant growth, both in soils contaminated by industrial activities and in acid agricultural soils. Although the adverse effects of trace metal(loid)s have long been recognized, there remains much unknown both about their behavior in soils, their toxicity to plants, and the mechanisms that plants use to tolerate elevated concentrations. Synchrotronbased approaches are being utilized increasingly in soil-plant systems to examine toxic metal(loid)s. In the present review, brief consideration is given to the theory of synchrotron radiation. Thereafter, we review the use of synchrotron-based approaches for the examination of various trace metal(loid)s in soil-plant systems, including aluminum, chromium, manganese, cobalt, nickel, copper, zinc, arsenic, selenium, and cadmium. Within the context of this review, X-ray absorption spectroscopy (XAS) and X-ray fluorescence microscopy (m-XRF) are of particular interest. These techniques can provide in situ analyses of the distribution and speciation of metal(loid)s in soil-plant systems. The information presented here serves not only to understand the behavior of trace metals in soil-plant systems, but also to provide examples of the potential applications of synchrotron radiation that can be used to advantage in other studies.