Reliability and sensitivity analysis of embedded systems with modular dynamic fault trees

5Citations
Citations of this article
11Readers
Mendeley users who have this article in their library.
Get full text

Abstract

Fault trees theories have been used in years because they can easily provide a concise representation of failure behavior of general non-repairable fault-tolerant systems. But the defect of traditional fault trees is lack of accuracy when modeling dynamic failure behavior of certain systems with fault-recovery process. A solution to this problem is called behavioral decomposition. A system will be divided into several dynamic or static modules, and each module can be further analyzed using BDD or Markov Chains separately. In this paper, we will show a decomposition scheme that independent subtrees of a dynamic module are detected and solved hierarchically for saving computation time of solving Markov Chains without losing unacceptable accuracy when assessing components sensitivities. In the end, we present our analyzing software toolkit that implements our enhanced methodology.

Cite

CITATION STYLE

APA

Lo, H. K., Huang, C. Y., Chang, Y. R., Huang, W. C., & Chang, J. R. (2005). Reliability and sensitivity analysis of embedded systems with modular dynamic fault trees. In IEEE Region 10 Annual International Conference, Proceedings/TENCON (Vol. 2007). Institute of Electrical and Electronics Engineers Inc. https://doi.org/10.1109/TENCON.2005.300968

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free