Research progress and applications of qplus noncontact atomic force microscopy

Abstract

Atomic force microscopy (AFM) is used to investigate surface structures by measuring the interaction force between the tip and sample. Noncontact AFM (NC-AFM) that incorporates a qPlus sensor further enhances the spatial resolution of scanning probe microscopy based on traditional AFM principles. In this perspective, we give a brief introduction to the mechanisms of high-resolution imaging and force measurements using NC-AFM. We then summarize recent applications of NC-AFM in the fields of on-surface chemical reactions, low-dimensional materials, surface charge distribution in molecules, as well as technical improvements and developments of NC-AFM technologies. The opportunities and challenges for NC-AFM technologies are also presented.