Quality factor sensitivity to crystallographic axis misalignment in silicon micromechanical resonators

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Abstract

We study the sensitivity of quality factor in single crystal silicon (SCS) micromechanical resonators to crystallographic axis misalignments that are present due to fabrication non-idealities. Our experimental results, being reported for the first time here, unveil that very small angular misalignment from [110] axis of transduction adversely affects the high Q of a bulk acoustic wave SCS resonator by more than 50%, unlike the misalignment errors about the [100] axis of transduction. Interestingly, when the axis of transduction is intentionally offset by a large angle from either [100] or [110], multiple peaks with comparable relative strength are observed from a single resonator.

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APA

Samarao, A. K., & Ayazi, F. (2010). Quality factor sensitivity to crystallographic axis misalignment in silicon micromechanical resonators. In Technical Digest - Solid-State Sensors, Actuators, and Microsystems Workshop (pp. 479–482). Transducer Research Foundation. https://doi.org/10.31438/trf.hh2010.130

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