Dependence of BiFeO3 thickness on exchange bias in BiFeO 3/ Co2FeAl multiferroic structures

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Abstract

We have grown BiFeO3 (BFO) thin films with different thickness on Si/SiO2/Ti/Pt(111) substrates by pulsed laser deposition. Half-metallic Co2FeAl (CFA) films with a thickness of 5 nm were then grown on the BFO films by magnetron sputtering. Through the magnetic hysteresis loops of the BFO/CFA heterostructure, we observe a direct correlation between the thickness of the BFO film and exchange bias (EB) field. The EB field exhibits fluctuation behavior with a cyclical BFO thickness of 60 nm, which is close to the spiral modulation wavelength (62 nm) of BFO. It indicates the influence of spiral modulation on the EB in the BFO/CFA multiferroic structure.

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Zhang, X., Zhang, D. L., Wang, Y. H., Miao, J., Xu, X. G., & Jiang, Y. (2011). Dependence of BiFeO3 thickness on exchange bias in BiFeO 3/ Co2FeAl multiferroic structures. In Journal of Physics: Conference Series (Vol. 263). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/263/1/012008

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