Site-selective XAFS spectroscopy tuned to surface active sites of Cu/ZnO and Cr/SiO2 catalysts

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Abstract

XAFS (X-ray absorption fine structure) spectra were measured by using the fluorescence spectrometer for the emitted X-ray from sample. The chemical shifts between Cu0 and CuI and between CrIII and CrVI were evaluated. Tuning the fluorescence spectrometer to each energy, the Cu0 and CuI site-selective XANES for Cu/ZnO catalyst were measured. The first one was similar to the XANES of Cu metal and the second one was the 5 : 5 average of XANES for CuI sites + Cu metal. The population ratio of copper site of the Cu/ZnO catalyst was found to be Cu metal : Cu2O : CuI atomically dispersed on surface = 70(±23) : 22(±14) : 8(±5). Site-selective XANES for CrIII site of Cr/SiO2 catalyst was also studied.

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Izumi, Y., Nagamori, H., Kiyotaki, F., & Minato, T. (2001). Site-selective XAFS spectroscopy tuned to surface active sites of Cu/ZnO and Cr/SiO2 catalysts. Journal of Synchrotron Radiation, 8(2), 605–607. https://doi.org/10.1107/S0909049500013881

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