Making IoT Networks Highly Fault-Tolerant Through Power Fault Prediction, Isolation and Composite Networking in the Device Layer

Abstract

High availability of the IoT network is challenging as the networks are prone to failures due to various faults occurring within the different layers of the IoT networks. Most of the failures in the device layer are due to furious signals created by the devices when the power left in the devices approaches the threshold level. Another frequent problem in this layer is communication failures due to a lack of fully functional communication paths. The fault tolerance of the IoT network gets depleted due to these failures.This paper introduces a novel method for predicting power fault occurrence and isolating such devices in the device layer. It also demonstrates the implementation of device clusters using different networking topologies, significantly enhancing the fault tolerance of IoT networks by providing multiple alternate communication paths. The proposed method has shown a remarkable improvement in the success rate (21 Percent), significantly increased the longevity of the IoT network (61 percent), and drastically reduced the false alarm rate (77 percent). It has also enhanced accuracy (1 Percent) compared to the nearest available models, demonstrating its effectiveness.