Abstract
The Hague, Netherlands, 1690. Christiaan Huygens and Sir Isaac Newton, at odds with their competing wave/particle theories of light, today reached a compromise with their unveiling of a new multibeam SEM/FIB instrument featuring an SEM column designed by Huygens that uses electromagnetic lenses to focus the beam of electrons and a FIB column employing electrostatic lenses to focus the beam of ions devised by Newton. Onlookers were dazzled by its extensive capabilities and range of applications.
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CITATION STYLE
McMahon, G., Rybczynski, J., Wang, Y., Gao, Y., Cai, D., Dhakal, P., … Naughton, M. (2009). Applications of Multibeam SEM/FIB Instrumentation in the Integrated Sciences. Microscopy Today, 17(4), 34–39. https://doi.org/10.1017/s1551929509000133
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