Effects of TbPtRu underlayer on microstructure and magnetic properties of CoPtCr-Si O2 perpendicular media

Abstract

The effects of a composite TbPtRu underlayer on the microstructure and magnetic properties of the CoPtCr-Si O2 perpendicular recording layer were studied. Among various underlayers of PtRu, TaPtRu, and TbPtRu, we demonstrated that the media with the TbPtRu underlayer exhibited an enhancement of Si O2 segregation at grain boundaries, a refinement of the grains, the narrow c -axis distribution, and consequently, improved magnetic properties. © 2006 American Institute of Physics.