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Atomic-Scale Analysis of Chemical Bonding of Delaminated Graphene at Faceted SiC by Aberration-Corrected Scanning Transmission Electron Microscopy

  • Nicotra G
  • Ramasse Q
  • Deretzis I
  • et al.
Microscopy and Microanalysis (2013) 19(S2) 1238-1239
DOI: 10.1017/s1431927613008180
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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Nicotra, G., Ramasse, Q. M., Deretzis, I., Bongiorno, C., Spinella, C., & Giannazzo, F. (2013). Atomic-Scale Analysis of Chemical Bonding of Delaminated Graphene at Faceted SiC by Aberration-Corrected Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 19(S2), 1238–1239. https://doi.org/10.1017/s1431927613008180

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