Some reasons of emission variation in InAs quantum dot-in-a-well structures

Abstract

Photoluminescence (PL) and X ray diffraction have been studied in InAs quantum dots (QDs) embedded in symmetric In0.15Ga1-0.15As/ GaAs quantum wells (dot-in-a-well, DWELL) with QDs grown at different temperatures. The density of QDs decreases from 1.1×1011 down to 1.3×1010 cm-2 with increasing the QD growth temperatures from 470 to 535°C. The QD density decreasing in DWELLs is accompanied by the non monotonous variation of QD parameters. The PL intensity increases and the PL peak shifts to low energy in structures with QDs grown at 490 and 510°C. On the contrary the structures with QDs grown at 525 and 535°C are characterized by lower PL intensities and PL peak positions shifted to higher energy. The method of X-ray diffraction has been applied with the aim to study the variation of elastic strain in DWELL structures with QDs grown at different temperatures. It was shown that the minimum of elastic strain corresponds to DWELL with QDs grown at 490-525 °C. For lower (470 °C) and higher (535 °C) QD growth temperatures the level of compressive strain increased in DWELLs. The reasons of strain variation are discussed as well. © 2010 IOP Publishing Ltd.