Time-resolved two-dimensional X-ray diffraction measurements of kinetic properties in polycrystalline high-pressure ices

Abstract

Time-resolved two-dimensional X-ray diffraction method has been applied to observe kinetic properties of polycrystalline high-pressure ices in diamond anvil cell. The relationships between the number of diffraction spots and the number of grains per radiated volume were calibrated at several beamlines of SPring-8 and Photon Factory. Based on the relationships, we examined kinetics of grain growth in ice VI and VII, and kinetics of the ice VI-VII and VI-VIII transformations, from the evolution of the number of diffraction spots. Preliminary results on these kinetic experiments are presented in this paper. © 2010 IOP Publishing Ltd.