Abstract
The analysis of oriented features in images requires two-dimensional directional wavelets. Among these, we study in detail the class of Cauchy wavelets, which are strictly supported in a (narrow) convex cone in spatial frequency space. They have excellent angular selectivity, as shown by a standard calibration test, and they have minimal uncertainty. In addition, we present a new application of directional wavelets, namely a technique for determining the symmetries of a given pattern with respect to rotations and dilation. © 1999 Academic Press.
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CITATION STYLE
Antoine, J. P., Murenzi, R., & Vandergheynst, P. (1999). Directional wavelets revisited: Cauchy wavelets and symmetry detection in patterns. Applied and Computational Harmonic Analysis, 6(3), 314–345. https://doi.org/10.1006/acha.1998.0255
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