Abstract
An effect of hysteretic magnetoresistance is demonstrated, which appears in lithographically patterned four-terminal nanostructures, consisting of two perpendicularly crossed nanowires formed in the epitaxial layer of a ferromagnetic (Ga, Mn)As semiconductor. In this effect, the zero-field resistance of a nanowire depends on the direction of the previously applied magnetic field, as a result of a rearrangement of magnetic domain walls located in the structure, which contribute an extra resistance to the nanowires. © 2009 American Institute of Physics.
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Wosinski, T., Figielski, T., Andrearczyk, T., Makosa, A., Wrobel, J., & Sadowski, J. (2009). Magneto-resistive memory in ferromagnetic (Ga,Mn)As nanostructures. In AIP Conference Proceedings (Vol. 1199, pp. 401–402). https://doi.org/10.1063/1.3295473
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