At the Advanced Light Source (ALS), Beamline 8.3.2 performs hard X-ray micro-tomography under conditions of high temperature, pressure, mechanical loading, and other realistic conditions using environmental test cells. With scan times of 10s-100s of seconds, the microstructural evolution of materials can be directly observed over multiple time steps spanning prescribed changes in the sample environment. This capability enables in-situ quasi-static mechanical testing of materials. We present an overview of our in-situ mechanical testing capabilities and recent hardware developments that enable flexural testing at high temperature and in combination with acoustic emission analysis.
CITATION STYLE
Barnard, H. S., MacDowell, A. A., Parkinson, D. Y., Mandal, P., Czabaj, M., Gao, Y., … Liu, D. (2017). Synchrotron X-ray micro-tomography at the Advanced Light Source: Developments in high-temperature in-situ mechanical testing. In Journal of Physics: Conference Series (Vol. 849). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/849/1/012043
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