Synchrotron X-ray micro-tomography at the Advanced Light Source: Developments in high-temperature in-situ mechanical testing

13Citations
Citations of this article
54Readers
Mendeley users who have this article in their library.

This article is free to access.

Abstract

At the Advanced Light Source (ALS), Beamline 8.3.2 performs hard X-ray micro-tomography under conditions of high temperature, pressure, mechanical loading, and other realistic conditions using environmental test cells. With scan times of 10s-100s of seconds, the microstructural evolution of materials can be directly observed over multiple time steps spanning prescribed changes in the sample environment. This capability enables in-situ quasi-static mechanical testing of materials. We present an overview of our in-situ mechanical testing capabilities and recent hardware developments that enable flexural testing at high temperature and in combination with acoustic emission analysis.

Cite

CITATION STYLE

APA

Barnard, H. S., MacDowell, A. A., Parkinson, D. Y., Mandal, P., Czabaj, M., Gao, Y., … Liu, D. (2017). Synchrotron X-ray micro-tomography at the Advanced Light Source: Developments in high-temperature in-situ mechanical testing. In Journal of Physics: Conference Series (Vol. 849). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/849/1/012043

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free