Improving Sensitivity in Soft X-ray STXM Using Low Energy X-ray Fluorescence

AP Hitchcock; T Tyliszczak; M Obst; G Swerhone; J Lawrence

Journal ArticleOPEN ACCESS

Improving Sensitivity in Soft X-ray STXM Using Low Energy X-ray Fluorescence

Hitchcock A
Tyliszczak T
Obst M
et al.

Microscopy and Microanalysis (2010) 16(S2) 924-925

DOI: 10.1017/s1431927610054899

N/ACitations

13Readers

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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APA

Hitchcock, A., Tyliszczak, T., Obst, M., Swerhone, G., & Lawrence, J. (2010). Improving Sensitivity in Soft X-ray STXM Using Low Energy X-ray Fluorescence. Microscopy and Microanalysis, 16(S2), 924–925. https://doi.org/10.1017/s1431927610054899

Improving Sensitivity in Soft X-ray STXM Using Low Energy X-ray Fluorescence

Abstract

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