The Effect of Sulfurisation Temperature on Structural Properties of CuAlS2 Thin Films

Abstract

CuAlS 2 thin films of the same thickness are deposited on suitably cleaned coning 7059 glass substrate by two stage vacuum thermal evaporation technique at room temperature and sulfurised at different temperatures. The structural properties studied by means of XRD revealed that the films are of crystalline in nature having tetragonal structure. For all the films the preferential orientation is [112]. The other orientations like [220], [312] and [400] were also observed in the films depending upon the sulfurisation temperatures. The values of lattice constants, grain size, micro strain and dislocation density of the films are calculated and the values agree strongly with ICDD data. Visual inspection of (SEM) micrographs of the films showed that crystallite size increase with increase in sulfurisation temperature.