In this paper, a novel Asymptotic Probability Estimation (APE) method is proposed to estimate the probability of correlated rare failure events for complex integrated systems containing a large number of replicated cells. The key idea is to approximate the failure rate of the entire system by solving a set of nonlinear equations derived from a general analytical model. An error refinement method based on Look-up Table (LUT) is further developed to improve numerical stability and, hence, reduce estimation error. Our numerical experiments demonstrate that compared to the state-of-The-Art method, APE can reduce the estimation error by up to 45x without increasing the computational cost.
CITATION STYLE
Tao, J., Yu, H., Zhou, D., Su, Y., Zeng, X., & Li, X. (2017). Correlated Rare Failure Analysis via Asymptotic Probability Evaluation. In Proceedings - Design Automation Conference (Vol. Part 128280). Institute of Electrical and Electronics Engineers Inc. https://doi.org/10.1145/3061639.3062217
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