Mobility overestimation due to gated contacts in organic field-effect transistors

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Abstract

Parameters used to describe the electrical properties of organic field-effect transistors, such as mobility and threshold voltage, are commonly extracted from measured current-voltage characteristics and interpreted by using the classical metal oxide-semiconductor field-effect transistor model. However, in recent reports of devices with ultra-high mobility (>40 cm 2 V -1 s -1), the device characteristics deviate from this idealized model and show an abrupt turn-on in the drain current when measured as a function of gate voltage. In order to investigate this phenomenon, here we report on single crystal rubrene transistors intentionally fabricated to exhibit an abrupt turn-on. We disentangle the channel properties from the contact resistance by using impedance spectroscopy and show that the current in such devices is governed by a gate bias dependence of the contact resistance. As a result, extracted mobility values from d.c. current-voltage characterization are overestimated by one order of magnitude or more.

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Bittle, E. G., Basham, J. I., Jackson, T. N., Jurchescu, O. D., & Gundlach, D. J. (2016). Mobility overestimation due to gated contacts in organic field-effect transistors. Nature Communications, 7. https://doi.org/10.1038/ncomms10908

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