Abstract
As the number of patent applications increases yearly, the negation relation between patents has become intertwined, which makes it difficult for constructing negation relation in patent examination manually. Therefore, how to automatically construct negation relation between patents has become the hot research. Constructing negation relation is the process of comparing technical features between patents, which depends on the technical features in the patent claims and the technical function-effect. Although there are many researches on patent one-to-one negation, few researches on patent multi-to-one negation. The research on negation relation of multi-to-one patents, has the following challenges: (1) the definition of patent features is ambiguous in comparison of negation relation; (2) the role of patent function-effect is often ignored in judgement of negation relation. To solve the above issues, we propose a technical function-effect based patent multi-to-one negation game model. In the model, we decompose patent technical features into technical utility and technical function-effect. Patent technical utility is mainly realized by using the valence theory in linguistics. After obtaining technical utility, we choose to have the same technical effect, express the technical features of different technical functions, and obtain the patent technical function-effect. Finally, we combine the technical utility and function-effect to construct a technical utility/function-effect game tree to judge the patent negation relation. According to the two-tailed test in the A/B-test, our model outperforms the baseline model in the evaluation measurement. This model can subsequently be used to calculate the portfolio value and the strategic value of the patents.
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CITATION STYLE
Du, L., Liu, W., Xiao, K., Gao, S., & Han, Y. (2022). Technical Function-effect Based Patent Multi-to-One Negation Game Model. In 2022 IEEE 25th International Conference on Computer Supported Cooperative Work in Design, CSCWD 2022 (pp. 1443–1448). Institute of Electrical and Electronics Engineers Inc. https://doi.org/10.1109/CSCWD54268.2022.9776122
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