Comment on "evaluation of the minority carrier diffusion length and edge surface-recombination velocity in GaAs p/n solar cells" [J. Appl. Phys. 72, 2919 (1992)]

Abstract

The recent findings of Hakimzadeh, Möller, and Bailey [J. Appl. Phys. 72, 2919 (1992)] regarding the determination of minority carrier diffusion length from electron-beam-induced current data are compared to the results of an earlier study by Luke, von Roos, and Cheng [J. Appl. Phys. 57, 1978 (1985)]. The differences are briefly discussed.