Characterization of the state of a droplet on a micro-textured silicon wafer using ultrasound

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Abstract

In this work, we propose acoustic characterization as a new method to probe wetting states on a superhydrophobic surface. The analysis of the multiple reflections of a longitudinal acoustic wave from solid-liquid and solid-vapor interfaces enables to distinguish between the two well known Cassie-Baxter and Wenzel wetting configurations. The phenomenon is investigated experimentally on silicon micro-pillars superhydrophobic surfaces and numerically using a finite difference time domain method. Numerical calculations of reflection coefficients show a good agreement with experimental measurements, and the method appears as a promising alternative to optical measurement methods. © 2012 American Institute of Physics.

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Saad, N., Dufour, R., Campistron, P., Nassar, G., Carlier, J., Harnois, M., … Nongaillard, B. (2012). Characterization of the state of a droplet on a micro-textured silicon wafer using ultrasound. Journal of Applied Physics, 112(10). https://doi.org/10.1063/1.4767223

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