Abstract
Pulse implementation or switching-off (PISO) of electrical currents has become a common operation in junctionerature (Tj) measurements for semiconductor devices since 2004. Here we have experimentally discovered a substantial discrepancy between Tj values with, and without, PISO (e.g., 36.8 °C versus 76.5 °C above the ambient temperature at 25.0 °C). Our research indicates that methods associated with PISO are flawed due to non-synchronization of lattice temperatures and carrier temperatures in transient states. To scrutinize this discrepancy, we propose a lattice-inertia thermal anchoring mechanism that (1) explains the cause of this discrepancy, (2) helps to develop a remedy to eliminate this discrepancy by identifying three transient phases, (3) has been applied to establishing an original, accurate, and noninvasive technique for light-emitting diodes to measure Tj in the absence of PISO. Our finding may pave the foundation for LED communities to further establish reliable junctiontemperature measurements based on the identified mechanism.
Cite
CITATION STYLE
Zhang, J., Shih, T., Lu, Y., Merlitz, H., Ru-Gin Chang, R., & Chen, Z. (2016). Non-synchronization of lattice and carrier temperatures in light-emitting diodes. Scientific Reports, 6. https://doi.org/10.1038/srep19539
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