The schlick fresnel approximation

Abstract

Reflection and refraction magnitudes are modeled using an approximation of the Fresnel reflectance equations called the Schlick approximation. This chapter presents the Schlick approximation, analyzes its error when compared to the full Fresnel reflectance equations, and motivates its use in ray tracing dielectric (non-conducting) materials. It further discusses the Schlick approximation in the context of metallic surfaces and shows a possible extension for the Schlick approximation to more accurately model reflectance of metals.